dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Martens, Koen | |
dc.contributor.author | Wang, Wei-E | |
dc.contributor.author | Hoffmann, Thomas Y. | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | De Meyer, Kristin | |
dc.date.accessioned | 2021-10-19T14:13:12Z | |
dc.date.available | 2021-10-19T14:13:12Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19056 | |
dc.source | IIOimport | |
dc.title | A fast and accurate method to study the impact of interface traps on germanium MOS performance | |
dc.type | Journal article | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Martens, Koen | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Martens, Koen::0000-0001-7135-5536 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 938 | |
dc.source.endpage | 944 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 4 | |
dc.source.volume | 58 | |
imec.availability | Published - imec | |