Authors

Hellings, Geert; Eneman, Geert; Mitard, Jerome; Martens, Koen; Wang, Wei-E; Hoffmann, Thomas Y.; Meuris, Marc; De Meyer, Kristin

ISSN

0018-9383

Issue

4

Journal

IEEE Transactions on Electron Devices

Volume

58

Title

A fast and accurate method to study the impact of interface traps on germanium MOS performance

Publication type

Journal article