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A fast and accurate method to study the impact of interface traps on germanium MOS performance
Publication:
A fast and accurate method to study the impact of interface traps on germanium MOS performance
Date
2011
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hellings, Geert
;
Eneman, Geert
;
Mitard, Jerome
;
Martens, Koen
;
Wang, Wei-E
;
Hoffmann, Thomas Y.
;
Meuris, Marc
;
De Meyer, Kristin
Journal
IEEE Transactions on Electron Devices
Abstract
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1979
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1979
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations