A fast and accurate method to study the impact of interface traps on germanium MOS performance

dc.contributor.author	Hellings, Geert
dc.contributor.author	Eneman, Geert
dc.contributor.author	Mitard, Jerome
dc.contributor.author	Martens, Koen
dc.contributor.author	Wang, Wei-E
dc.contributor.author	Hoffmann, Thomas Y.
dc.contributor.author	Meuris, Marc
dc.contributor.author	De Meyer, Kristin
dc.contributor.imecauthor	Hellings, Geert
dc.contributor.imecauthor	Eneman, Geert
dc.contributor.imecauthor	Mitard, Jerome
dc.contributor.imecauthor	Martens, Koen
dc.contributor.imecauthor	Meuris, Marc
dc.contributor.imecauthor	De Meyer, Kristin
dc.contributor.orcidimec	Hellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimec	Eneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimec	Mitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimec	Martens, Koen::0000-0001-7135-5536
dc.contributor.orcidimec	Meuris, Marc::0000-0002-9580-6810
dc.date.accessioned	2021-10-19T14:13:12Z
dc.date.available	2021-10-19T14:13:12Z
dc.date.issued	2011
dc.identifier.issn	0018-9383
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/19056
dc.source.beginpage	938
dc.source.endpage	944
dc.source.issue	4
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	58
dc.title	A fast and accurate method to study the impact of interface traps on germanium MOS performance
dc.type	Journal article
dspace.entity.type	Publication
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