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Analytical model and qualititative analysis of the interface-trap charge pumping characteristics of MOS structure
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Analytical model and qualititative analysis of the interface-trap charge pumping characteristics of MOS structure
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Date
1997
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Habas, Predrag
Journal
Abstract
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1864
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Acq. date: 2025-12-11
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Metrics
Views
1864
since deposited on 2021-09-30
2
last month
1
last week
Acq. date: 2025-12-11
Citations