Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Analytical model and qualititative analysis of the interface-trap charge pumping characteristics of MOS structure
Publication:
Analytical model and qualititative analysis of the interface-trap charge pumping characteristics of MOS structure
Date
1997
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
1883.pdf
710.09 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Habas, Predrag
Journal
Abstract
Description
Metrics
Views
1859
since deposited on 2021-09-30
398
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1859
since deposited on 2021-09-30
398
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations