Show simple item record

dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-19T14:40:34Z
dc.date.available2021-10-19T14:40:34Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19146
dc.sourceIIOimport
dc.titleRecent trends in CMOS front-end reliability (tutorial)
dc.typeOral presentation
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewno
dc.source.conference17th Conference on Insulating Films on Semiconductors - INFOS
dc.source.conferencedate21/06/2011
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record