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Recent trends in CMOS reliability: from individual traps to circuit simulations

dc.contributor.authorKaczer, Ben
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorFranco, Jacopo
dc.contributor.authorGrasser, Tibor
dc.contributor.authorRoussel, Philippe
dc.contributor.authorCamargo, Vinicius V. A.
dc.contributor.authorMahato, Swaraj
dc.contributor.authorSimoen, Eddy
dc.contributor.authorWirth, Gilson I.
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-19T14:41:38Z
dc.date.available2021-10-19T14:41:38Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19149
dc.sourceIIOimport
dc.titleRecent trends in CMOS reliability: from individual traps to circuit simulations
dc.typeOral presentation
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorMahato, Swaraj
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceIEEE International Integrated Reliability Workshop - IIRW
dc.source.conferencedate16/10/2011
dc.source.conferencelocationLake Tahoe, CA USA
imec.availabilityPublished - imec


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