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The impact of junction angle on tunnel FETs

dc.contributor.authorKao, Frank
dc.contributor.authorVerhulst, Anne
dc.contributor.authorVandenberghe, William
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-19T14:44:18Z
dc.date.available2021-10-19T14:44:18Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19158
dc.sourceIIOimport
dc.titleThe impact of junction angle on tunnel FETs
dc.typeProceedings paper
dc.contributor.imecauthorKao, Frank
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference12th International Conference on Ultimate Integration on Silicon - ULIS
dc.source.conferencedate14/03/2011
dc.source.conferencelocationCork Ireland
imec.availabilityPublished - open access


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