Authors

Kobayashi, Daisuke; Simoen, Eddy; Put, Sofie; Griffoni, Alessio; Poizat, Marc; Hirose, Kazuyuki; Claeys, Cor

ISSN

0018-9499

Issue

3

Journal

IEEE Transactions on Nuclear Science

Volume

58

Title

Proton-induced mobility degradation in FinFETs with stressor layers and strained SOI substrates

Publication type

Journal article

Embargo date

9999-12-31