dc.contributor.author | Kobayashi, Daisuke | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Put, Sofie | |
dc.contributor.author | Griffoni, Alessio | |
dc.contributor.author | Poizat, Marc | |
dc.contributor.author | Hirose, Kazuyuki | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-19T14:53:47Z | |
dc.date.available | 2021-10-19T14:53:47Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0018-9499 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19187 | |
dc.source | IIOimport | |
dc.title | Proton-induced mobility degradation in FinFETs with stressor layers and strained SOI substrates | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 800 | |
dc.source.endpage | 807 | |
dc.source.journal | IEEE Transactions on Nuclear Science | |
dc.source.issue | 3 | |
dc.source.volume | 58 | |
dc.identifier.url | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5720535 | |
imec.availability | Published - open access | |