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Integrated diffusion-recombination model for describing the logarithic time dependency of plasma damage in porous low-k materials
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Integrated diffusion-recombination model for describing the logarithic time dependency of plasma damage in porous low-k materials
Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kunnen, Eddy
;
Barkema, Gerard
;
Maes, Christian
;
Shamiryan, Denis
;
Urbanowicz, Adam
;
Struyf, Herbert
;
Baklanov, Mikhaïl
Journal
Microelectronic Engineering
Abstract
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1842
since deposited on 2021-10-19
Acq. date: 2025-10-25
Citations
Metrics
Views
1842
since deposited on 2021-10-19
Acq. date: 2025-10-25
Citations