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Transition intensities and noise spectra in submicron MOSFETs

dc.contributor.authorHärtler, G.
dc.contributor.authorGolze, U.
dc.contributor.authorSikula, J.
dc.contributor.authorHruska, P.
dc.contributor.authorVasina, Petr
dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-09-30T08:24:11Z
dc.date.available2021-09-30T08:24:11Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1921
dc.sourceIIOimport
dc.titleTransition intensities and noise spectra in submicron MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage224
dc.source.endpage227
dc.source.conferenceNoise in Physical Systems and 1/f Fluctuations: Proceedings of the 14th International Conference
dc.source.conferencedate14/07/1997
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - open access


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