| dc.contributor.author | Lauwereins, Rudy | |
| dc.date.accessioned | 2021-10-19T15:14:05Z | |
| dc.date.available | 2021-10-19T15:14:05Z | |
| dc.date.issued | 2011 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19248 | |
| dc.source | IIOimport | |
| dc.title | Scaling below 22 nm: the voltage problem | |
| dc.type | Oral presentation | |
| dc.contributor.imecauthor | Lauwereins, Rudy | |
| dc.contributor.orcidimec | Lauwereins, Rudy::0000-0002-3861-0168 | |
| dc.date.embargo | 9999-12-31 | |
| dc.source.peerreview | no | |
| dc.source.conference | Design, Automation and Test in Europe Conference - DATE | |
| dc.source.conferencedate | 14/03/2011 | |
| dc.source.conferencelocation | Grenoble France | |
| imec.availability | Published - open access | |
| imec.internalnotes | Invited speech; executive session 3.1 on 22nm challenges and/wealth/knowledge creation opportunities | |
