Mobility analysis of surface roughness scattering in FinFET devices

Metadata

Show full item record

Authors

Lee, Jae Woo; Jang, Doyoung; Mouis, Mireille; Kim, Gyu Tae; Chiarella, Thomas; Hoffmann, Thomas Y.; Ghibaudo, Gérard

ISSN

0038-1101

Issue

1

Journal

Solid-State Electronics

Volume

62

Title

Mobility analysis of surface roughness scattering in FinFET devices

Publication type

Journal article

Collections

Articles