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Mobility analysis of surface roughness scattering in FinFET devices

dc.contributor.authorLee, Jae Woo
dc.contributor.authorJang, Doyoung
dc.contributor.authorMouis, Mireille
dc.contributor.authorKim, Gyu Tae
dc.contributor.authorChiarella, Thomas
dc.contributor.authorHoffmann, Thomas Y.
dc.contributor.authorGhibaudo, Gérard
dc.date.accessioned2021-10-19T15:20:45Z
dc.date.available2021-10-19T15:20:45Z
dc.date.issued2011
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19268
dc.sourceIIOimport
dc.titleMobility analysis of surface roughness scattering in FinFET devices
dc.typeJournal article
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.source.peerreviewyes
dc.source.beginpage195
dc.source.endpage201
dc.source.journalSolid-State Electronics
dc.source.issue1
dc.source.volume62
imec.availabilityPublished - imec


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