Publication:

Electrical characterization of the MOS (metal-oxide-semiconductor) system: High mobility substrates

Date

2011
Proceedings Paper
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Author(s)

Lin, Dennis  
;
Brammertz, Guy  
;
Sioncke, Sonja
;
Nyns, Laura  
;
Alian, AliReza  
;
Wang, Wei-E
;
Heyns, Marc  
;
Caymax, Matty  
;
Hoffmann, Thomas Y.

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