Challenges and solutions for ESD protection in advanced logic and RF CMOS technologies

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Authors
Linten, Dimitri; Thijs, Steven; Raczkowski, Kuba; Griffoni, Alessio; Chen, Shih-Hung; Song, Ming-Hsiang; Nauwelaers, Bart; Groeseneken, Guido
Conference
Taiwan ESD and Reilability Conference
Title
Challenges and solutions for ESD protection in advanced logic and RF CMOS technologies
Publication type
Proceedings paper
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