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Impact of lateral charge migration on the retention performance of planar and 3D SONOS devices

dc.contributor.authorMaconi, Alessadro
dc.contributor.authorArreghini, Antonio
dc.contributor.authorMonzio Compagnoni, Christian
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorSpinelli, Alessandro S.
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorLacaita, Andrea Leonardo
dc.date.accessioned2021-10-19T15:50:39Z
dc.date.available2021-10-19T15:50:39Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19352
dc.sourceIIOimport
dc.titleImpact of lateral charge migration on the retention performance of planar and 3D SONOS devices
dc.typeProceedings paper
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage195
dc.source.endpage198
dc.source.conference41st European Solid-State Device Conference - ESSDERC
dc.source.conferencedate13/09/2011
dc.source.conferencelocationHelsinki Finland
imec.availabilityPublished - open access


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