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AlGaN-on-Si-based 10-um pixel-to-pixel pitch hybrid imagers for the EUV range

dc.contributor.authorMalinowski, Pawel
dc.contributor.authorDuboz, Jean-Yves
dc.contributor.authorDe Moor, Piet
dc.contributor.authorJohn, Joachim
dc.contributor.authorMinoglou, Kiki
dc.contributor.authorSrivastava, Puneet
dc.contributor.authorSemond, Fabrice
dc.contributor.authorFrayssinet, Eric
dc.contributor.authorGiordanengo, Boris
dc.contributor.authorBenMoussa, Ali
dc.contributor.authorKroth, Udo
dc.contributor.authorGottwald, Alexander
dc.contributor.authorLaubis, Christian
dc.contributor.authorMertens, Robert
dc.contributor.authorVan Hoof, Chris
dc.date.accessioned2021-10-19T15:55:36Z
dc.date.available2021-10-19T15:55:36Z
dc.date.issued2011
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19365
dc.sourceIIOimport
dc.titleAlGaN-on-Si-based 10-um pixel-to-pixel pitch hybrid imagers for the EUV range
dc.typeJournal article
dc.contributor.imecauthorMalinowski, Pawel
dc.contributor.imecauthorDe Moor, Piet
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorMertens, Robert
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.orcidimecMalinowski, Pawel::0000-0002-2934-470X
dc.source.peerreviewyes
dc.source.beginpage1561
dc.source.endpage1563
dc.source.journalIEEE Electron Device Letters
dc.source.issue11
dc.source.volume32
dc.identifier.urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5993494
imec.availabilityPublished - imec


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