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Noise characterization of gated silicon p-n diodes

dc.contributor.authorHou, F. C.
dc.contributor.authorBosman, Gijs
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-30T08:27:04Z
dc.date.available2021-09-30T08:27:04Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1936
dc.sourceIIOimport
dc.titleNoise characterization of gated silicon p-n diodes
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage542
dc.source.endpage545
dc.source.conferenceNoise in Physical Systems and 1/f Fluctuations: Proceedings of the 14th International Conference
dc.source.conferencedate14/07/1997
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - open access


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