Authors

Martens, Koen; Radu, Iuliana; Mertens, Sofie; Shi, Xiaoping; Schaekers, Marc; Tielens, Hilde; Huyghebaert, Cedric; De Gendt, Stefan; Jurczak, Gosia; Afanasev, Valeri; Heyns, Marc; Kittl, Jorge

Conference

1st International Workshop on Resistive RAM

Title

Electrical characterization of the metal-vanadium dioxide interface and implications for memory applications

Publication type

Oral presentation