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Electrical characterization of the metal-vanadium dioxide interface and vanadium dioxide work function

dc.contributor.authorMartens, Koen
dc.contributor.authorRadu, Iuliana
dc.contributor.authorMertens, Sofie
dc.contributor.authorShi, Xiaoping
dc.contributor.authorSchaekers, Marc
dc.contributor.authorTielens, Hilde
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorJurczak, Gosia
dc.contributor.authorAfanas'ev, Valerie
dc.contributor.authorHeyns, Marc
dc.contributor.authorKittl, Jorge
dc.date.accessioned2021-10-19T16:07:15Z
dc.date.available2021-10-19T16:07:15Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19395
dc.sourceIIOimport
dc.titleElectrical characterization of the metal-vanadium dioxide interface and vanadium dioxide work function
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.imecauthorMertens, Sofie
dc.contributor.imecauthorSchaekers, Marc
dc.contributor.imecauthorTielens, Hilde
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.contributor.orcidimecMertens, Sofie::0000-0002-1482-6730
dc.contributor.orcidimecSchaekers, Marc::0000-0002-1496-7816
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.source.peerreviewno
dc.source.conferenceIEEE Semiconductor Interface Specialist Conference - SISC
dc.source.conferencedate1/12/2011
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - imec


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