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Evidence and characterization of crystallographic defect and material quality after SLIM-cut process

dc.contributor.authorMasolin, Alex
dc.contributor.authorVaes, Jan
dc.contributor.authorDross, Frederic
dc.contributor.authorPesquera, Amaia
dc.contributor.authorPoortmans, Jef
dc.contributor.authorMertens, Robert
dc.date.accessioned2021-10-19T16:09:16Z
dc.date.available2021-10-19T16:09:16Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19400
dc.sourceIIOimport
dc.titleEvidence and characterization of crystallographic defect and material quality after SLIM-cut process
dc.typeProceedings paper
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorMertens, Robert
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewyes
dc.source.beginpage1323-c04-05
dc.source.conferenceAdvanced Materials Processing for Scalable Solar-Cell Manufacturing
dc.source.conferencedate25/04/2011
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec
imec.internalnotesMRS Symposium Proceedings; Vol. 1323


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