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Compositional analysis of NiO thin films grwon by MOCVD

dc.contributor.authorMeersschaut, Johan
dc.date.accessioned2021-10-19T16:12:39Z
dc.date.available2021-10-19T16:12:39Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19409
dc.sourceIIOimport
dc.titleCompositional analysis of NiO thin films grwon by MOCVD
dc.typeProceedings paper
dc.contributor.imecauthorMeersschaut, Johan
dc.contributor.orcidimecMeersschaut, Johan::0000-0003-2467-1784
dc.source.peerreviewyes
dc.source.conference6th International Workshop on High-Resolution Depth Profiling
dc.source.conferencedate27/06/2011
dc.source.conferencelocationParis Frace
imec.availabilityPublished - imec


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