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Electroluminescence analysis of time-dependent reverse-bias degradation of HEMTs: a complete model

dc.contributor.authorMeneghini, Matteo
dc.contributor.authorStocco, Antonio
dc.contributor.authorBertini, Marco
dc.contributor.authorRonchi, Nicolò
dc.contributor.authorChini, Alessandro
dc.contributor.authorMarcon, Denis
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorZanoni, Enrico
dc.date.accessioned2021-10-19T16:13:02Z
dc.date.available2021-10-19T16:13:02Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19410
dc.sourceIIOimport
dc.titleElectroluminescence analysis of time-dependent reverse-bias degradation of HEMTs: a complete model
dc.typeProceedings paper
dc.contributor.imecauthorMarcon, Denis
dc.source.peerreviewno
dc.source.beginpage469
dc.source.endpage472
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate5/12/2011
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - imec


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