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Device to product level assessment of process variability

dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorDobrovolny, Petr
dc.contributor.authorZuber, Paul
dc.contributor.authorRoussel, Philippe
dc.date.accessioned2021-10-19T16:21:26Z
dc.date.available2021-10-19T16:21:26Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19431
dc.sourceIIOimport
dc.titleDevice to product level assessment of process variability
dc.typeOral presentation
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewno
dc.source.conferenceEuropean Workshop on CMOS Variability
dc.source.conferencedate30/05/2011
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


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