dc.contributor.author | Miranda Corbalan, Miguel | |
dc.contributor.author | Zuber, Paul | |
dc.contributor.author | Dobrovolny, Petr | |
dc.contributor.author | Roussel, Philippe | |
dc.date.accessioned | 2021-10-19T16:22:10Z | |
dc.date.available | 2021-10-19T16:22:10Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19433 | |
dc.source | IIOimport | |
dc.title | Variability aware modeling for yield enhancement of SRAM and logic | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Zuber, Paul | |
dc.contributor.imecauthor | Dobrovolny, Petr | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.orcidimec | Dobrovolny, Petr::0000-0002-1465-481X | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1153 | |
dc.source.endpage | 1158 | |
dc.source.conference | Design Automation and Test In Europe Conference - DATE | |
dc.source.conferencedate | 14/03/2011 | |
dc.source.conferencelocation | Grenoble France | |
imec.availability | Published - open access | |