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Variability aware modeling for yield enhancement of SRAM and logic

dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorZuber, Paul
dc.contributor.authorDobrovolny, Petr
dc.contributor.authorRoussel, Philippe
dc.date.accessioned2021-10-19T16:22:10Z
dc.date.available2021-10-19T16:22:10Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19433
dc.sourceIIOimport
dc.titleVariability aware modeling for yield enhancement of SRAM and logic
dc.typeProceedings paper
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1153
dc.source.endpage1158
dc.source.conferenceDesign Automation and Test In Europe Conference - DATE
dc.source.conferencedate14/03/2011
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - open access


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