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Wafer scale III-V/Si integration for mid-infrared spectroscopic applications

dc.contributor.authorMuneeb, Muhammad
dc.date.accessioned2021-10-19T16:34:45Z
dc.date.available2021-10-19T16:34:45Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19463
dc.sourceIIOimport
dc.titleWafer scale III-V/Si integration for mid-infrared spectroscopic applications
dc.typeProceedings paper
dc.contributor.imecauthorMuneeb, Muhammad
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage97
dc.source.conference12th FEA PhD Symposium
dc.source.conferencedate7/12/2011
dc.source.conferencelocationGent Belgium
imec.availabilityPublished - open access


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