Authors

Nyns, Laura; Lin, Dennis; Brammertz, Guy; Bellenger, Florence; Sioncke, Sonja; Van Elshocht, Sven; Caymax, Matty

Conference

219th ECS Meeting. Symposium E3 - Grpahene, Ge/III-V, and Emerging Materials for Post CMOS Applications 3

Title

Interface and border traps in Ge-based gate stacks

Publication type

Meeting abstract