dc.contributor.author | Orzali, Tommaso | |
dc.contributor.author | Wang, G. | |
dc.contributor.author | Waldron, Niamh | |
dc.contributor.author | Richard, Olivier | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Wang, Wei-E | |
dc.contributor.author | Caymax, Matty | |
dc.date.accessioned | 2021-10-19T16:58:43Z | |
dc.date.available | 2021-10-19T16:58:43Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19523 | |
dc.source | IIOimport | |
dc.title | In-Situ HCl etching of InP in shallow-trench-isolated structures | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Waldron, Niamh | |
dc.contributor.imecauthor | Richard, Olivier | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.orcidimec | Richard, Olivier::0000-0002-3994-8021 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 345 | |
dc.source.endpage | 354 | |
dc.source.conference | ULSI Process Integration 7 | |
dc.source.conferencedate | 9/10/2011 | |
dc.source.conferencelocation | Boston, MA USA | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 41, Issue 7 | |