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A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations

dc.contributor.authorPadovani, Andrea
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVandelli, Luca
dc.contributor.authorLarcher, Luca
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorPavan, Paolo
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-19T17:02:11Z
dc.date.available2021-10-19T17:02:11Z
dc.date.issued2011
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19531
dc.sourceIIOimport
dc.titleA comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
dc.typeJournal article
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3147
dc.source.endpage3155
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue9
dc.source.volume58
imec.availabilityPublished - open access


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