Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Feasibility study of Mo/SiOx/Pt resistive random access memory in inverter circuit for FPGA applications
Publication:
Feasibility study of Mo/SiOx/Pt resistive random access memory in inverter circuit for FPGA applications
Date
2011
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
23769.pdf
328.54 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Park, Sangsu
;
Shin, Jungho
;
Cimino, Salvatore
;
Jung, Seungjae
;
Lee, Joonmyoung
;
Kim, Seonghyun
;
Park, Jubong
;
Lee, Wootae
;
Son, Myungwoo
;
Lee, Byunghun
;
Pantisano, Luigi
;
Hwang, Hyngsang
Journal
IEEE Electron Device Letters
Abstract
Description
Metrics
Views
1883
since deposited on 2021-10-19
422
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1883
since deposited on 2021-10-19
422
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations