dc.contributor.author | Pollentier, Ivan | |
dc.contributor.author | Neira, Imanol | |
dc.contributor.author | Gronheid, Roel | |
dc.date.accessioned | 2021-10-19T17:25:43Z | |
dc.date.available | 2021-10-19T17:25:43Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19588 | |
dc.source | IIOimport | |
dc.title | Assessment of resist outgassing related EUV optics contamination for CAR and non-CAR material chemistries | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Pollentier, Ivan | |
dc.contributor.imecauthor | Gronheid, Roel | |
dc.contributor.orcidimec | Pollentier, Ivan::0000-0002-4266-6500 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 797208 | |
dc.source.conference | Advances in Resist Materials and Processing Technology XXVIII | |
dc.source.conferencedate | 27/02/2011 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings SPIE, Vol.7972 | |