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TOFSIMS and XPS characterization of stearic acid Langmuir-Blodgett films

dc.contributor.authorKenens, Conny
dc.contributor.authorConard, Thierry
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-09-30T08:32:21Z
dc.date.available2021-09-30T08:32:21Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1962
dc.sourceIIOimport
dc.titleTOFSIMS and XPS characterization of stearic acid Langmuir-Blodgett films
dc.typeOral presentation
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.source.peerreviewno
dc.source.conferenceSIMS XI; 8-12 September 1997; Orlando, Fl., USA.
dc.source.conferencelocation
imec.availabilityPublished - imec


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