dc.contributor.author | Rafi, J.-M. | |
dc.contributor.author | Vanhellemont, J. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Chen, Jimmy | |
dc.contributor.author | Yang, D. | |
dc.contributor.author | Zabala, M. | |
dc.contributor.author | China, E. | |
dc.contributor.author | Lechon, M. | |
dc.date.accessioned | 2021-10-19T17:49:52Z | |
dc.date.available | 2021-10-19T17:49:52Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19646 | |
dc.source | IIOimport | |
dc.title | Diode characteristics and thermal donor formation in germanium-doped silicon substrates | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.conference | 26th International Conference on Defects in Semiconductors - ICDS | |
dc.source.conferencedate | 18/07/2011 | |
dc.source.conferencelocation | Christchurch New Zealand | |
imec.availability | Published - imec | |