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Neutron-induced multiple bit upsets on dynamically-stressed commercial SRAM arrays

dc.contributor.authorRech, Paolo
dc.contributor.authorGalliere, Jean-Marc
dc.contributor.authorGirard, Patrick
dc.contributor.authorGriffoni, Alessio
dc.contributor.authorWrobel, Frederic
dc.contributor.authorSaigné, Frederic
dc.contributor.authorDilillo, Luigi
dc.date.accessioned2021-10-19T18:01:51Z
dc.date.available2021-10-19T18:01:51Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19674
dc.sourceIIOimport
dc.titleNeutron-induced multiple bit upsets on dynamically-stressed commercial SRAM arrays
dc.typeProceedings paper
dc.source.peerreviewyes
dc.source.beginpage274
dc.source.endpage280
dc.source.conferenceEuropean Conference on Radiation Effects on Component and Systems - RADECS
dc.source.conferencedate19/09/2011
dc.source.conferencelocationSevilla Spain
imec.availabilityPublished - imec


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