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dc.contributor.authorRothschild, Aude
dc.contributor.authorNishibe, Nishibe
dc.contributor.authorCui, Jianli
dc.contributor.authorZhu, Nanchang
dc.contributor.authorDebucquoy, Maarten
dc.contributor.authorMamagkakis, Stylianos
dc.contributor.authorNagaswami, Venkat
dc.contributor.authorJohn, Joachim
dc.date.accessioned2021-10-19T18:16:57Z
dc.date.available2021-10-19T18:16:57Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19707
dc.sourceIIOimport
dc.titleAl2O3 surface passivation : electrical characterization using the Quantox tool
dc.typeProceedings paper
dc.contributor.imecauthorDebucquoy, Maarten
dc.contributor.imecauthorJohn, Joachim
dc.contributor.orcidimecDebucquoy, Maarten::0000-0001-5980-188X
dc.source.peerreviewno
dc.source.conference37th IEEE Photovoltaic Specialists Conference - PVSC
dc.source.conferencedate19/06/2011
dc.source.conferencelocationSeattle, WA USA
imec.availabilityPublished - imec


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