dc.contributor.author | Rothschild, Aude | |
dc.contributor.author | Nishibe, Nishibe | |
dc.contributor.author | Cui, Jianli | |
dc.contributor.author | Zhu, Nanchang | |
dc.contributor.author | Debucquoy, Maarten | |
dc.contributor.author | Mamagkakis, Stylianos | |
dc.contributor.author | Nagaswami, Venkat | |
dc.contributor.author | John, Joachim | |
dc.date.accessioned | 2021-10-19T18:16:57Z | |
dc.date.available | 2021-10-19T18:16:57Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19707 | |
dc.source | IIOimport | |
dc.title | Al2O3 surface passivation : electrical characterization using the Quantox tool | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Debucquoy, Maarten | |
dc.contributor.imecauthor | John, Joachim | |
dc.contributor.orcidimec | Debucquoy, Maarten::0000-0001-5980-188X | |
dc.source.peerreview | no | |
dc.source.conference | 37th IEEE Photovoltaic Specialists Conference - PVSC | |
dc.source.conferencedate | 19/06/2011 | |
dc.source.conferencelocation | Seattle, WA USA | |
imec.availability | Published - imec | |