Publication:
Random telegraph noise: from a defect spectroscopic tool to a deep submicron CMOS circuit threat
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1815 since deposited on 2021-10-19
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Acq. date: 2026-07-16
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Views
1815 since deposited on 2021-10-19
2last month
1last week
Acq. date: 2026-07-16
Citations