dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Rothschild, Aude | |
dc.contributor.author | Vermang, Bart | |
dc.contributor.author | Poortmans, Jef | |
dc.contributor.author | Mertens, Robert | |
dc.date.accessioned | 2021-10-19T18:56:55Z | |
dc.date.available | 2021-10-19T18:56:55Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19796 | |
dc.source | IIOimport | |
dc.title | A deep level transient spectroscopy comparison of the SiO2/Si and Al2O3/Si interface states | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Vermang, Bart | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.imecauthor | Mertens, Robert | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Vermang, Bart::0000-0003-2669-2087 | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 37 | |
dc.source.endpage | 44 | |
dc.source.conference | Photovoltaics for the 21st Century 7 | |
dc.source.conferencedate | 9/10/2011 | |
dc.source.conferencelocation | Boston, MA USA | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 41, Issue 4 | |