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dc.contributor.authorSmets, Gerrit
dc.contributor.authorRosseel, Erik
dc.contributor.authorSterckx, Gunther
dc.contributor.authorBogdanowicz, Janusz
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorShaughnessy, Derrick
dc.date.accessioned2021-10-19T19:01:42Z
dc.date.available2021-10-19T19:01:42Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19806
dc.sourceIIOimport
dc.titleTransfer from Rs-based to PMOR-based ion implantation process monitoring
dc.typeProceedings paper
dc.contributor.imecauthorSmets, Gerrit
dc.contributor.imecauthorRosseel, Erik
dc.contributor.imecauthorSterckx, Gunther
dc.contributor.imecauthorBogdanowicz, Janusz
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecBogdanowicz, Janusz::0000-0002-7503-8922
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage426
dc.source.endpage431
dc.source.conferenceIon Implantation Technology 2010. 18th International Conference
dc.source.conferencedate6/06/2010
dc.source.conferencelocationKyoto Japan
imec.availabilityPublished - open access


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