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Effect of biaxial mechanical strain in the analog operation of fully depleted SOI transistors as a function of temperature

dc.contributor.authorSouza, F.N.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorPavanello, M.A.
dc.date.accessioned2021-10-19T19:06:37Z
dc.date.available2021-10-19T19:06:37Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19817
dc.sourceIIOimport
dc.titleEffect of biaxial mechanical strain in the analog operation of fully depleted SOI transistors as a function of temperature
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1432
dc.source.conference219th ECS Meeting
dc.source.conferencedate1/05/2011
dc.source.conferencelocationMontreal Canada
imec.availabilityPublished - open access
imec.internalnotesMeeting abstracts; Vol. MA2011-01


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