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Benchmarking on-chip optical against electrical interconnect for high-performance applications

dc.contributor.authorStucchi, Michele
dc.contributor.authorCosemans, Stefan
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorTokei, Zsolt
dc.contributor.authorBeyer, Gerald
dc.date.accessioned2021-10-19T19:19:54Z
dc.date.available2021-10-19T19:19:54Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19845
dc.sourceIIOimport
dc.titleBenchmarking on-chip optical against electrical interconnect for high-performance applications
dc.typeProceedings paper
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.imecauthorBeyer, Gerald
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage3.2
dc.source.conferenceIEEE International Interconnect Technology Conference and Materials for Advanced Metallization - IITC/MAM
dc.source.conferencedate9/05/2011
dc.source.conferencelocationDresden Germany
imec.availabilityPublished - open access


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