dc.contributor.author | Toledano Luque, Maria | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Zahid, Mohammed | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Blomme, Pieter | |
dc.contributor.author | Kittl, Jorge | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-19T19:43:06Z | |
dc.date.available | 2021-10-19T19:43:06Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19895 | |
dc.source | IIOimport | |
dc.title | Fast VTH transients after the program/erase of flash memory stacks with high-k dielectrics | |
dc.type | Journal article | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Blomme, Pieter | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 631 | |
dc.source.endpage | 640 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 3 | |
dc.source.volume | 58 | |
imec.availability | Published - open access | |