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Fast VTH transients after the program/erase of flash memory stacks with high-k dielectrics
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Fast VTH transients after the program/erase of flash memory stacks with high-k dielectrics
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Toledano Luque, Maria
;
Degraeve, Robin
;
Zahid, Mohammed
;
Kaczer, Ben
;
Blomme, Pieter
;
Kittl, Jorge
;
Jurczak, Gosia
;
Van Houdt, Jan
;
Groeseneken, Guido
Journal
IEEE Transactions on Electron Devices
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Views
1868
since deposited on 2021-10-19
1
last month
Acq. date: 2026-02-25
Citations