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Fast VTH transients after the program/erase of flash memory stacks with high-k dielectrics
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Authors
Toledano Luque, Maria
;
Degraeve, Robin
;
Zahid, Mohammed
;
Kaczer, Ben
;
Blomme, Pieter
;
Kittl, Jorge
;
Jurczak, Gosia
;
Van Houdt, Jan
;
Groeseneken, Guido
ISSN
0018-9383
Issue
3
Journal
IEEE Transactions on Electron Devices
Volume
58
Title
Fast VTH transients after the program/erase of flash memory stacks with high-k dielectrics
Publication type
Journal article
Embargo date
9999-12-31
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