Publication:

Fast VTH transients after the program/erase of flash memory stacks with high-k dielectrics

Date

2011

Journal article

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Files

21542.pdf 1.41 MB

Author(s)

Toledano Luque, Maria

;

Degraeve, Robin

;

Zahid, Mohammed

;

;

;

;

;

;

Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Statistics

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Acq. date: 2026-08-28