dc.contributor.author | Toledano Luque, Maria | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Grasser, Tibor | |
dc.contributor.author | Wirth, G.I. | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Vrancken, Christa | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-19T19:45:08Z | |
dc.date.available | 2021-10-19T19:45:08Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19899 | |
dc.source | IIOimport | |
dc.title | Response of a single trap to AC negative bias temperature stress | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Vrancken, Christa | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 364 | |
dc.source.endpage | 371 | |
dc.source.conference | IEEE International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 10/04/2011 | |
dc.source.conferencelocation | Monterey, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | 4A.2 | |