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Studying local aluminum back surface fields (AL-BSF) contacts through scanning spreading resistance microscopy (SSRM)

dc.contributor.authorUruena De Castro, Angel
dc.contributor.authorJohn, Joachim
dc.contributor.authorEyben, Pierre
dc.contributor.authorVanhaeren, Danielle
dc.contributor.authorWerner, Thilo
dc.contributor.authorHantschel, Thomas
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorPoortmans, Jef
dc.contributor.authorMertens, Robert
dc.date.accessioned2021-10-19T20:00:53Z
dc.date.available2021-10-19T20:00:53Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19930
dc.sourceIIOimport
dc.titleStudying local aluminum back surface fields (AL-BSF) contacts through scanning spreading resistance microscopy (SSRM)
dc.typeProceedings paper
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVanhaeren, Danielle
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorMertens, Robert
dc.contributor.orcidimecVanhaeren, Danielle::0000-0001-8624-9533
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1530
dc.source.endpage1533
dc.source.conference26th European Photovoltaic Solar Energy Conference - EU PVSEC
dc.source.conferencedate5/09/2011
dc.source.conferencelocationHamburg Germany
imec.availabilityPublished - open access


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