NCD – electrodes for probing the stability of DNA duplexes by electronic denaturation monitoring
dc.contributor.author | Van Grinsven, B. | |
dc.contributor.author | Vanden Bon, N. | |
dc.contributor.author | Bäcker, M. | |
dc.contributor.author | Vermeeren, V. | |
dc.contributor.author | Michiels, L. | |
dc.contributor.author | Janssens, S.D. | |
dc.contributor.author | Haenen, Ken | |
dc.contributor.author | Wagner, Patrick | |
dc.contributor.author | Schöning, M.J. | |
dc.date.accessioned | 2021-10-19T20:20:51Z | |
dc.date.available | 2021-10-19T20:20:51Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19973 | |
dc.source | IIOimport | |
dc.title | NCD – electrodes for probing the stability of DNA duplexes by electronic denaturation monitoring | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Haenen, Ken | |
dc.contributor.orcidimec | Haenen, Ken::0000-0001-6711-7367 | |
dc.source.peerreview | no | |
dc.source.conference | Hasselt Diamond Workshop – SBDD XVI | |
dc.source.conferencedate | 21/02/2011 | |
dc.source.conferencelocation | Hasselt Belgium | |
imec.availability | Published - imec |
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