dc.contributor.author | Vereecke, Guy | |
dc.contributor.author | Claes, Martine | |
dc.contributor.author | Le, Quoc Toan | |
dc.contributor.author | Kesters, Els | |
dc.contributor.author | Struyf, Herbert | |
dc.contributor.author | Carleer, Robert | |
dc.contributor.author | Adriaensens, Peter | |
dc.date.accessioned | 2021-10-19T21:00:10Z | |
dc.date.available | 2021-10-19T21:00:10Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 1099-0062 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20055 | |
dc.source | IIOimport | |
dc.title | Characterization of modification of 193-nm photoresist by HBr plasma | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vereecke, Guy | |
dc.contributor.imecauthor | Claes, Martine | |
dc.contributor.imecauthor | Le, Quoc Toan | |
dc.contributor.imecauthor | Kesters, Els | |
dc.contributor.imecauthor | Struyf, Herbert | |
dc.contributor.imecauthor | Adriaensens, Peter | |
dc.contributor.orcidimec | Vereecke, Guy::0000-0001-9058-9338 | |
dc.contributor.orcidimec | Le, Quoc Toan::0000-0002-0206-6279 | |
dc.source.peerreview | yes | |
dc.source.beginpage | H408 | |
dc.source.endpage | H410 | |
dc.source.journal | Electrochemical and Solid-State Letters | |
dc.source.issue | 10 | |
dc.source.volume | 14 | |
dc.identifier.url | http://link.aip.org/link/?ESL/14/H408 | |
imec.availability | Published - imec | |