Publication:
Interface defects of the new type detected by the noise method in SOI and SOS MOSFETs
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1975 since deposited on 2021-09-30
1last month
Acq. date: 2026-02-25
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Statistics
Views
1975 since deposited on 2021-09-30
1last month
Acq. date: 2026-02-25
Citations