Compositional characterization of nickel silicides by HAADF-STEM imaging

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Authors

Verleysen, Eveline; Bender, Hugo; Richard, Olivier; Schryvers, Nick; Vandervorst, Wilfried

DOI

10.1007/s10853-010-5191-z

ISSN

0022-2461

Issue

7

Journal

Journal of Materials Science

Volume

46

Title

Compositional characterization of nickel silicides by HAADF-STEM imaging

Publication type

Journal article

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